Accelerated Testing: Statistical Models, Test Plans, and Data AnalysisAuthor: Wayne B. Nelson Publisher: John Wiley & Sons Published: 12 01 2007 Pages: 624 Binding Type: Paperback Weight: 1. 81lbs Size: 8. 93h x 6. 38w x 1. 16d ISBN: 9780471697367 About the Author WAYNE B. NELSON, PhD, is a leading expert on analysis of reliability and accelerated test data. Formerly with General Electric Research & Development for twenty three years, he now privately consults on and teaches engineering applications of statistics for
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Accelerated Testing: Statistical Models, Test Plans, and Data Analysis